Trademark Search  /  INTEGRATED METROLOGY

INTEGRATED METROLOGY

● Live · Registered

U.S. federal trademark · Serial No. 76075179 · Reg. No. 2657329

Mark
INTEGRATED METROLOGY
Status
Registered
Serial Number
76075179
Registration No.
2657329
Filing Date
June 22, 2000
Registration Date
December 3, 2002
Class(es)
Class 009

Owners

ONTO INNOVATION INC.
03 · WILMINGTON, MA, US
Nanometrics Incorporated
03 · MILPITAS, CA, US
Nanometrics Incorporated
03 · Milpitas, CA, US

Goods & Services

Thin film and wafer surface measurement and inspection products which are designed to fit inside or be mounted onto production equipment used in the manufacturing of integrated circuits, such as chemical mechanical polishers, chemical vapor deposition systems, and other related equipment

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Source: USPTO federal trademark records. Informational only, not legal advice. Status and details may lag the live USPTO database.