U.S. federal trademark · Serial No. 73345524 · Reg. No. 1234403
Electron Microscopes Instrumentation-Namely, Scanning Electron Microscopes and Transmission Electron Microscopes, and Accessories Therefor-Namely, Automatic Contrast/Brightness Modules, Gamma Controls, Micrograph Identification Systems, Scan Rotation-Tilt Correction Units, Derivative Processing Units, Y-Modulation Units, Beam Blanking Units, Accessory Mode Select Units, Scanning Transmission Detection Attachments, Specimen Amplifier Units, Specimen Current Meters, Electron Detection Units, Power Supply, Cathodoluminescence Detection Units, Sputter-Coaters, Carbon Coating Attachments, Cameras with Special Hoods, Water Recirculators, Tilting Substages, Cold Cathode Gauges, TV Scanning Attachments, Scan Control Input and Connectors, X-Ray Spectrometer Units, Signal Mixing Units, Anti-Contamination Units, Automated Stage Controls, Line Width Measuring Units, Selected Area Channeling Pattern Units, Airlock Mechanism Units, Multi-Feed Units and Spare Parts
Source: USPTO federal trademark records. Informational only, not legal advice. Status and details may lag the live USPTO database.