U.S. federal trademark · Serial No. 79031217
Optical measuring devices, in particular measuring devices for examining electronic components, such as semiconductor wafers, optical defect inspection devices for the detection of particles, micro-surface roughness and surface defects, optical layer thickness measuring devices for the layer thickness measurement of transparent layers, such as laser ellipsometers; combined optical measuring devices, in particular combined defect inspection devices and layer thickness measuring devices
Source: USPTO federal trademark records. Informational only, not legal advice. Status and details may lag the live USPTO database.