U.S. federal trademark · Serial No. 97016523 · Reg. No. 6822693
Engineering services related to testing on a probe array for testing integrated circuit chips; technical advice, information and consultancy in relation to testing on a probe array for testing integrated circuit chips design and development of probe arrays for testing integrated circuit chips
Test fixtures in the nature of apparatus for testing integrated circuits, contact test pins for integrated circuit testers, and integrated circuit test sockets, and components thereof; housings for test contacts in an integrated circuit tester, semiconductor testing apparatus
Source: USPTO federal trademark records. Informational only, not legal advice. Status and details may lag the live USPTO database.