U.S. federal trademark · Serial No. 79117503 · Reg. No. 4348580
Instruments for inspection, testing and metrology of semiconductor wafers and devices, namely, X-ray and ultraviolet apparatus for analyzing semiconductor wafers and microelectronics; analytical instruments, namely, instruments based on X-rays and ultraviolet radiation, namely, spectrometers, diffractometers, reflectometers and fluorometers
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