U.S. federal trademark · Serial No. 98202826
Test fixtures in the nature of apparatus for testing integrated circuits, contact test pins for integrated circuit testers, and integrated circuit test sockets, and components thereof; housings for test contacts in an integrated circuit tester, semiconductor testing apparatus
Engineering services related to testing on a probe array for testing integrated circuit chips; technical advice, information and consultancy in relation to testing on a probe array for testing integrated circuit chips; design and development of probe arrays for testing integrated circuit chips
Source: USPTO federal trademark records. Informational only, not legal advice. Status and details may lag the live USPTO database.