U.S. federal trademark · Serial No. 86818669 · Reg. No. 5448920
Computer hardware; semiconductor and wafer defect inspection systems; computer software for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing industries; computer software for testing and inspecting physical and electrical properties of semiconductors, integrated circuits and microelectronics; a feature of semiconductor and wafer defect inspection systems for improving the detection of defects on advanced logic and memory IC devices across a broad range of process layers
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