Scientific devices, namely non-contact measuring systems comprised of non-contact sensors, computer controlled multi-axis controllers, moving axis and analytical software, used to measure and evaluate surfaces or boundary layers of nanotechnology products, using laser, light, sound, electrical current, reflected energy or x-ray technology

'analyt':24 'axi':19,22 'boundari':33 'compris':9 'comput':15 'contact':6,13 'control':16,20 'current':43 'devic':2 'electr':42 'energi':45 'evalu':30 'laser':39 'layer':34 'light':40 'measur':7,28 'move':21 'multi':18 'multi-axi':17 'name':3 'nanotechnolog':36 'non':5,12 'non-contact':4,11 'product':37 'ray':49 'reflect':44 'scientif':1 'sensor':14 'softwar':25 'sound':41 'surfac':31 'system':8 'technolog':50 'use':26,38 'x':48 'x-ray':47

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