A connectivity device for diagnostic equipment used in the inspection, review and measurement of manufactured semiconductor elements in the nature of wafers, reticles, and flat panel displays, for the purpose of integrating the diagnostic equipment with dedicated electronic servers or platforms

'connect':2 'dedic':37 'devic':3 'diagnost':5,34 'display':27 'electron':38 'element':17 'equip':6,35 'flat':25 'inspect':10 'integr':32 'manufactur':15 'measur':13 'natur':20 'panel':26 'platform':41 'purpos':30 'reticl':23 'review':11 'semiconductor':16 'server':39 'use':7 'wafer':22

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