U.S. federal trademark · Serial No. 73471543 · Reg. No. 1338876
Semiconductor Wafer Lithography Characterization System Comprised of Some or All of the Following: Programmable Computer, Graphics Terminal, Graphic Printer, and Programmable x-y Prober with Optics and Probe Card
Source: USPTO federal trademark records. Informational only, not legal advice. Status and details may lag the live USPTO database.