U.S. federal trademark · Serial No. 87923948 · Reg. No. 6091521
instruments for testing, inspecting, and characterizing physical properties of semiconductor wafers, integrated circuits, and reticles; computer hardware and software used for testing, inspecting, and characterizing physical properties of semiconductor wafers, integrated circuits, and reticles; computer hardware and software used for monitoring and controlling semiconductor wafer, integrated circuit, and reticle manufacturing processes; computer hardware and software used for providing feedback about device parameters used in the manufacturing of semiconductor wafers, integrated circuits, and reticles
Source: USPTO federal trademark records. Informational only, not legal advice. Status and details may lag the live USPTO database.