U.S. federal trademark · Serial No. 79361282 · Reg. No. 7362263
Optical inspection apparatus for semi-conductor materials and elements; semiconductor photomask optical inspection apparatus; imaging apparatus, namely, optical imaging apparatus for inspection of semiconductor photomasks; semiconductor photomask blanks optical inspection apparatus; imaging apparatus, namely, optical imaging apparatus for inspection of semiconductor photomask blanks; semiconductor wafer optical inspection apparatus; imaging apparatus, namely, optical imaging apparatus for inspection of semiconductor wafer; semi-conductor testing machines and instruments; photomask blanks defect detectors; testing apparatus not for medical purposes, namely, semiconductor testing apparatus; precision measuring apparatus for defects of photomask blanks
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