Recorded computer software that enables design and optimization of devices from materials based on performance, reliability and variability requirements; recorded computer software for modeling the characteristics and performance of semiconductor devices; recorded computer software for extracting material properties from the interpretation of electrical measurements

'base':13 'characterist':26 'comput':2,21,33 'design':6 'devic':10,31 'electr':43 'enabl':5 'extract':36 'interpret':41 'materi':12,37 'measur':44 'model':24 'optim':8 'perform':15,28 'properti':38 'record':1,20,32 'reliabl':16 'requir':19 'semiconductor':30 'softwar':3,22,34 'variabl':18

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