U.S. federal trademark · Serial No. 79198316 · Reg. No. 5193611
Electronic imaging platforms in the field of inspection of semiconductor materials, namely, semiconductor wafers and reticles; downloadable image processing software for electronic imaging platforms in the field of inspection of semiconductor materials, namely, semiconductor wafers and reticles and operating system software for electronic imaging platforms in the field of inspection of semiconductor materials, namely, semiconductor wafers and reticles
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