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MJC

● Live · Registered

U.S. federal trademark · Serial No. 79168629 · Reg. No. 5070509

Mark
MJC
Status
Registered
Serial Number
79168629
Registration No.
5070509
Filing Date
June 23, 2014
Registration Date
November 1, 2016
Class(es)
Class 007, Class 009, Class 037, Class 042

Owners

KABUSHIKI KAISHA NIHON MICRONICS
03 · Musashino-shi Tokyo, JP
KABUSHIKI KAISHA NIHON MICRONICS
03 · JP
KABUSHIKI KAISHA NIHON MICRONICS
03 · JP

Goods & Services

Repair and maintenance of electronic machines and apparatus; [ repair and maintenance of telecommunication machines and apparatus; installation, repair and maintenance of solar batteries; installation, maintenance and repair of electric batteries; installation, maintenance and repair of electric accumulators; ] repair and maintenance of probe cards for use in inspection of semi-conductors; [ repair and maintenance of apparatus for inspection of probe cards; ] repair and maintenance of apparatus for inspection of electrical characteristics of semi-conductors; repair and maintenance of apparatus for measuring integrated circuits; [ repair and maintenance of apparatus for inspecting liquid crystal display panels; ] repair and maintenance of measuring and testing machines and instruments [ ; repair and maintenance of electric or magnetic meters and testers ]

[ design and development of computer programs designed to the specifications of others ]

[ Probe cards for use in inspection of liquid crystal panels; apparatus for measuring the electrical properties of liquid crystal display panels; ] Electric contacts for measuring or testing machines and instruments; [ testing machines for integrated circuits; testing machines for flat panel displays; ] probe cards for use in testing of integrated circuits or flat panel displays; [ batteries, electric; accumulators, electric; batteries and cells; equipment for inspection of electrical characteristics of solar batteries and cells for solar batteries; measuring or testing machines and instruments for use in appearance inspection of wafers for solar batteries and cells for solar batteries; measuring or testing machines and instruments for use in inspection of solar batteries; ] probe cards for use in inspection of semi-conductors; [ probe cards for use in inspection of liquid crystal display panels; ] testing apparatus for testing of electrical characteristics of semi-conductors; semiconductor wafer probers; [ semiconductor testing apparatus comprising a master controller computer and a mass interconnect connector interface for connection to a plurality of test instruments for testing electrical characteristics of semi-conductors and measuring semiconductor integrated circuits; ] liquid crystal display testing equipment, namely, automated optical inspection (AOI) systems comprised of an automated camera and computerized controller connected to the camera, probe units, blade-type probes, film type probes, manual probers for organic light-emitting diodes (OLEDs), and lighting units for light-up testing for OLEDs

[ machines for manufacturing solar batteries ]

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Source: USPTO federal trademark records. Informational only, not legal advice. Status and details may lag the live USPTO database.