Trademark Search  /  MMX

MMX

● Live · Pending

U.S. federal trademark · Serial No. 98446808

Mark
MMX
Status
Pending
Serial Number
98446808
Filing Date
March 13, 2024
Class(es)
Class 007, Class 009, Class 037, Class 042

Owners

Mycronic AB
99 · Täby, SE
Mycronic AB
99 · Täby, SE

Goods & Services

installation services for machines, apparatus, systems and instruments that are used in the manufacturing of photomasks, screens, semiconductors, circuit boards, and computer chips; installation services for of semiconductor manufacturing machines and systems; repair and maintenance of machines, apparatus, systems and instruments that are used in the manufacturing of photomasks, screens, semiconductors, circuit boards, and computer chips; repair or maintenance of semiconductor manufacturing machines and systems; providing information relating to the repair or maintenance of semiconductor manufacturing machines and systems

design, engineering, research, and development of photomasks, screens, semiconductors, circuit boards, and computer chips; testing the functionality of photomasks, screens, semiconductors, circuit boards, and computer chips; design, engineering, research, development, and testing services in the field of manufacturing of photomasks, screens, semiconductors, circuit boards, and computer chips; scientific and technological services, namely, design, engineering, research, and development of machines, apparatus, and instruments used in the manufacturing of photomasks, screens, semiconductors, circuit boards, and computer chips; testing the functionality of machines, apparatus, and instruments used in the manufacturing of photomasks, screens, semiconductors, circuit boards, and computer chips; design, engineering, research, and development of data paths for pattern converters and systems for performing advanced processing operations on electronic pattern data and design; testing the functionality of data paths for pattern converters and systems for performing advanced processing operations on electronic pattern data and design; technical advice, information, and consultancy in relation to the design and development of photomasks, screens, semiconductors, circuit boards, and computer chips; technical advice, information, and consultancy in relation to the design and development of machines, apparatus, and instruments used in the production of photomasks, screens, semiconductors, circuit boards, and computer chips; technical advice, information and consultancy in relation to the design and development of data paths for pattern converters and systems for performing advanced processing operations on electronic pattern data and design; design and development of computer software; design and development of computer hardware; product research and development; quality control services being quality control for others; quality management services, namely, quality control in the field of photomasks; quality management services, namely, quality control and testing in the fields of photomasks, screens, semiconductors, circuit boards, and computer chips; testing of semiconductors and photomasks; product testing; product quality testing; quality control for others; quality control of goods and services; providing online non-downloadable computer software used for measuring, inspecting, monitoring, detecting, testing and quality control of photomasks; installation, maintenance and repair of computer software

machines and machine tools for use in the manufacturing of semiconductors, semiconductor circuits, semiconductor chips, semiconductor wafers, semiconductor discs, computer chips, screens, and monitors, and structural parts thereof; components for machine and machine tools, namely, slit valves, wafer handlers, motion feedthroughs, orientors, actuators, gas lines, gate valves, connectors, beam lines, flexible couplings, lifters, leak detectors, XYZ manipulators, valve stem seals, torque couplings, ultra-high vacuum systems, and pressure transducers for use in the manufacturing of semiconductors, semiconductor circuits, semiconductor chips, semiconductor wafers, semiconductor discs, computer chips, screens, and monitors, and structural parts thereof; machines and machine tools for use in the manufacturing of photomasks, substrates, photomask substrates, circuit boards, printed circuit boards, solar cells, and display screens, and structural parts thereof; components for machine and machine tools, namely, slit valves, wafer handlers, motion feedthroughs, orientors, actuators, gas lines, gate valves, connectors, beam lines, flexible couplings, lifters, leak detectors, XYZ manipulators, valve stem seals, torque couplings, ultra-high vacuum systems, and pressure transducers for use in the manufacturing of photomasks, substrates, photomask substrates, circuit boards, printed circuit boards, solar cells, and display screens, and parts thereof

pattern converters and systems performing advanced processing operations on electronic pattern data paths, namely, data processors, calculating machines, data processing equipment and computers, and apparatus and instruments for recording, transmitting, reproducing or processing sound, images or data in the semiconductor industry; data processing apparatus and equipment; calculating machines, data processing equipment and computers; laser equipment and laser measuring systems for measuring and inspecting photomasks, substrates, semiconductor discs, semiconductor wafers, circuit boards, printed circuit boards, photocells, photovoltaics cells, and glass panels for display screen; camera-based measuring system that measures the placement of the structure of the photomask; optical sensors; measuring apparatus and instruments, namely, measuring lasers and optical inspection apparatus for use during production of photomasks for displays and semiconductors; measuring devices, namely, lasers for measuring; electric sensors; testing apparatus and instruments, namely, measuring lasers and optical inspection apparatus for use during production of photomasks for displays and semiconductors; testing apparatus, namely, optical inspection apparatus for inspection of semiconductor materials, namely, semiconductor wafers, reticles, and photomasks; testing and quality control devices in the nature of scientific apparatus, namely, sensing and signaling devices for measurement and quality control of materials processing by laser; optical inspection apparatus and instruments for inspection of semiconductor materials, namely, semiconductor wafers, reticles, and photomasks; optical apparatus and instruments, namely, optical sensors, optical frequency metrology devices, optical semiconductors, optical disk drives, optical code readers, optical inspection apparatus, and optical profilers; optical inspection apparatus for industrial use; optical frequency metrology devices; downloadable and recorded computer software for use in measuring, inspecting, monitoring, detecting, testing and quality control of photomasks

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Source: USPTO federal trademark records. Informational only, not legal advice. Status and details may lag the live USPTO database.