U.S. federal trademark · Serial No. 76391620 · Reg. No. 0702562
Laser ellipsometry metrology apparatus, namely, laser ellipsometers and laser reflectometers used in silicon and the compound semiconductor industry, x-ray fluorescence analyzers and testers for discs and wafers
Source: USPTO federal trademark records. Informational only, not legal advice. Status and details may lag the live USPTO database.