U.S. federal trademark · Serial No. 98780912 · Reg. No. 02457415
Diode; chips in the nature of integrated circuits; mask in the nature of photomask substrate, namely, synthetic quartz glass plates being structural parts of excimer steppers, for use in fabrication of integrated circuits; semiconductors; Integrated Circuit (IC) substrate, namely, specialized printed circuit board (PCB) designed to hold and connect integrated circuits or computer chips; microcircuits in the nature of electronic circuits; integrated circuits; electronic circuit; semiconductor chip; semiconductor components in the nature of semiconductors, semiconductor memory units, semiconductor chip sets, semiconductor power elements and semiconductor integrated circuits; very large scale integration (VLSI) semiconductor integrated circuits; semiconductor devices; probe for testing semiconductors; probes for scientific purposes; circuit tester; diode detector; probe card for semiconductor testing in the nature of an electromechanical display interface between the wafer or chip and the testing equipment; probes for scientific purposes, namely, for use in the measurement and testing of wafers; downloadable computer software for use in semiconductor failure analysis; downloadable computer programs for use in semiconductor failure analysis
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