U.S. federal trademark · Serial No. 79078411 · Reg. No. 3910337
Scientific research, and technological consultation and research in the field of semiconductor manufacturing and new product design services relating thereto; industrial analysis and research services in the field of semiconductor manufacturing; design and development of computer hardware and software, namely, for quality control systems; quality control for others; calibration and functional testing of measuring apparatus; services of a technical measuring and test laboratory; technical research services relating to development of methods and algorithms for analysis of measured data and image analysis; engineering, in particular opto-mechanical engineering and measurement engineering
Apparatus and instruments for conducting, switching, transforming, accumulating, regulating or controlling electricity, namely, optical inspection apparatus for industrial use, all for wafer inspection; computer software and hardware for use with quality control systems, instruments and apparatus for use in inspecting of semiconductors, photo-voltaic modules, flat screens as well as for use in monitoring and controlling factory manufacturing processes; optical goods, namely, illumination optical lenses, telecentric imaging optical lenses, imaging apparatus and systems and installations consisting of electronic imaging platforms in the field of inspection of semiconductor materials, namely, semiconductor wafers and reticles
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