Microscopes; Diffraction apparatus for microscopes; Physics apparatus; Diodes; Chips; Photomasks; Semiconductors; Semiconductor substrates; Microcircuits; Silicon crystals; Integrated circuits; Electronic circuits; Semiconductor chips; Semiconductor elements; Very large scale integration (VLSI) semiconductor integrated circuits; Semiconductor devices; Probes; Probes for scientific purposes; Circuit testers; Diode detectors; Probe cards for testing semiconductors; Wafer probe cards; Computer software; Computer programs; all the aforementioned goods having nanotechnology treated characteristics or relating to nanotechnology

'aforement':58 'apparatus':3,7 'card':45,51 'characterist':63 'chip':9,22 'circuit':18,20,32,40 'comput':52,54 'crystal':16 'detector':43 'devic':34 'diffract':2 'diod':8,42 'electron':19 'element':24 'good':59 'integr':17,28,31 'larg':26 'microcircuit':14 'microscop':1,5 'nanotechnolog':61,67 'photomask':10 'physic':6 'probe':35,36,44,50 'program':55 'purpos':39 'relat':65 'scale':27 'scientif':38 'semiconductor':11,12,21,23,30,33,48 'silicon':15 'softwar':53 'substrat':13 'test':47 'tester':41 'treat':62 'vlsi':29 'wafer':49

NANO E- NANO-E- ANALYSIS SYSTEM

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