Engineering and engineering services for design-for-manufacturing to provide die-level measurements of integrated circuit parameters at very deep submicron levels with key measurements of threshold voltage matching, resistance and capacitance matching

'capacit':34 'circuit':18 'deep':22 'design':7 'design-for-manufactur':6 'die':13 'die-level':12 'engin':1,3 'integr':17 'key':26 'level':14,24 'manufactur':9 'match':31,35 'measur':15,27 'paramet':19 'provid':11 'resist':32 'servic':4 'submicron':23 'threshold':29 'voltag':30

Die-level process monitors that provide critical component matching and measurements of integrated circuit parameters at very deep submicron levels with key measurements of threshold voltage matching, resistance and capacitance matching

'capacit':31 'circuit':15 'compon':9 'critic':8 'deep':19 'die':2 'die-level':1 'integr':14 'key':23 'level':3,21 'match':10,28,32 'measur':12,24 'monitor':5 'paramet':16 'process':4 'provid':7 'resist':29 'submicron':20 'threshold':26 'voltag':27

NANODFM

Owner

Goods & Services