U.S. federal trademark · Serial No. 77653441 · Reg. No. 3681748
Optical Critical Dimension (OCD) computer software used for modeling and analysis of physical structures on semiconductor wafers and other substrates with microscopic features, contains a graphical user interface (GUI) which allows the user to model the structures in 2D and 3D, as well as perform sensitivity studies and other analytical functions, and contains at its core a powerful OCD engine for fast and reliable OCD modeling and analysis
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