U.S. federal trademark · Serial No. 78849978 · Reg. No. 3935753
Scanning electron microscopes; scanning transmission electron microscopes; Focused ion beam system for the design, inspection and manufacture of semiconductors; compatible specimen holders for scanning electron microscopes, scanning transmission electron microscopes, scanning transmission electron microscopes, and focused ion beam systems; electronic devices to integrate focused ion beam systems with a scanning transmission electron microscope or a transmission electron microscope for the design, inspection and manufacture of semiconductors
Source: USPTO federal trademark records. Informational only, not legal advice. Status and details may lag the live USPTO database.