Machine vision software/hardware that finds small image defects in large image objects; Specifically, it is used for localizing or finding small objects, defects, or anomalies within a larger object or field of view; For use in a variety of industries and applications including but not limited to - defect detection in semiconductor and electronic device manufacturing, quality control of printed documents, inspection of pharmaceutical materials, satellite image comparison, anomaly detection in radiographs and tomography scans, defect detection in manufactured consumer goods

'anomali':25,68 'applic':42 'comparison':67 'consum':79 'control':57 'defect':8,23,48,75 'detect':49,69,76 'devic':54 'document':60 'electron':53 'field':31 'find':5,20 'good':80 'imag':7,11,66 'includ':43 'industri':40 'inspect':61 'larg':10 'larger':28 'limit':46 'local':18 'machin':1 'manufactur':55,78 'materi':64 'object':12,22,29 'pharmaceut':63 'print':59 'qualiti':56 'radiograph':71 'satellit':65 'scan':74 'semiconductor':51 'small':6,21 'software/hardware':3 'specif':13 'tomographi':73 'use':16,35 'varieti':38 'view':33 'vision':2 'within':26

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