U.S. federal trademark · Serial No. 79246209 · Reg. No. 5899588
Computer hardware and software for the design and manufacture of semiconductor wafers and masks; metrology and inspection tools, namely, metrology and inspection computer hardware, micro-processors and electronic sensors for measuring, detecting and inspecting chemical compositions, temperature, light images, thickness, flatness, texture, line width and contamination of semiconductor wafers and masks during the manufacturing process; none of the foregoing in the field of fiber optics
Services of technical specialists in the area of metrology, namely, scientific research in the area of semiconductor manufacturing technology; technological services with reference to semiconductor lithography, namely, provision technical consultation in the field of placement techniques for Sub-Resolution Assist Features (SRAF) in order to improve the semiconductor manufacturing process; none of the foregoing in the field of fiber optics
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