Trademark Search  /  NFDM-3600

NFDM-3600

○ Dead · Abandoned

U.S. federal trademark · Serial No. 86441705

Mark
NFDM-3600
Status
Abandoned
Serial Number
86441705
Filing Date
October 31, 2014
Class(es)
Class 009

Owners

NIKON CORPORATION
03 · Tokyo, JP
NIKON CORPORATION
03 · Tokyo, JP

Goods & Services

Semiconductor testing apparatus; Semiconductor wafer testing apparatus

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Source: USPTO federal trademark records. Informational only, not legal advice. Status and details may lag the live USPTO database.