U.S. federal trademark · Serial No. 79413337 · Reg. No. 8072772
Measuring apparatus, namely non-contact 3D form metrology tools, optical interferometers, white-light confocal microscopes, confocal sensors, 3D laser scanners, structured light scanners, profilometers, all for use in high-precision measurement and analysis of surfaces, surface forms and the optical and technical components; calibration apparatus for 3D surface metrology; metrology tools and instruments, namely surface metrology tools, 3D form metrology tools, custom metrology instruments for 3D surface metrology, ultra-precision aspherical and freeform optics metrology instruments for measuring and analysis of surfaces and surface forms, and the optical and technical components; optical measurement devices, namely non-contact optical measurement instruments for high-precision measurement and analysis of surface form, roughness, micro- and nano-structures, meta optics, and the topography of optical and technical components; downloadable software for operating the aforementioned tools, devices, apparatus and instruments, and controlling and analysing their generated data and information
Source: USPTO federal trademark records. Informational only, not legal advice. Status and details may lag the live USPTO database.