U.S. federal trademark · Serial No. 88459495 · Reg. No. 5914950
downloadable computer software for controlling nanotechnology instruments, namely, microscopes, measuring apparatus and measuring instruments, namely, atomic force microscopes, scanning probe microscopes, integrated AFM and confocal Raman systems, integrated AFM with interferometers for nano-IR infrared measurements, scanning tunneling microscopes; downloadable computer software for controlling image acquisition in the field of chemistry, physics, biology, semiconductors, metrology, material science
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