Trademark Search  /  NUFLARE, BEYOND THE LEADING EDGE

NUFLARE, BEYOND THE LEADING EDGE

● Live · Pending

U.S. federal trademark · Serial No. 79435834

Mark
NUFLARE, BEYOND THE LEADING EDGE
Status
Pending
Serial Number
79435834
Filing Date
September 17, 2025
Class(es)
Class 007, Class 009, Class 037

Owner

NuFlare Technology, Inc.
03 · JP

Goods & Services

Laboratory apparatus and instruments; measuring or testing machines and instruments; product inspection equipment for defect detection; optical machines and apparatus; electric or magnetic meters and testers; telecommunication machines and apparatus; semiconductor testing apparatus; probes for testing semiconductors; semiconductor photomask inspection machines; photomask imaging device for semiconductor; phase indicators for semiconductors; semiconductor wafer defect classification device; semiconductor mask blanks defect analyzer; electron microscopes; detectors; precision measuring apparatus; data processing apparatus; electric installations for the remote control of semiconductor manufacturing machines; data sets, recorded or downloadable; computer software; virtual reality software; computer software, recorded; computer programs, recorded; computer programs, downloadable; computer hardware; industrial optical inspection equipment; temperature indicators; electric control devices for heating management.

Construction; construction consultancy; repair or maintenance of optical machines and instruments; repair or maintenance of laboratory apparatus and instruments; repair, maintenance or cleaning of semiconductor manufacturing machines and systems and provision of information relating thereto; installation of semiconductor manufacturing machines and equipment and provision of information relating thereto; repair, maintenance or washing of electronic components manufacturing machines and systems and provision of information relating thereto; installation of electronic components manufacturing machines and equipment and provision of information related thereto; maintenance, repair, and cleaning of measuring instruments and equipment and related information provision; installation of measuring instruments and equipment and related information provision; maintenance, repair, and cleaning of semiconductor inspection equipment, and related information provision; installation for semiconductor inspection equipment and related information provision; maintenance, repair, and cleaning of epitaxial growth equipment for semiconductor manufacturing and related information provision; installation for epitaxial growth equipment for semiconductor manufacturing and related information provision; maintenance, repair, and cleaning of semiconductor photomask inspection equipment and provision of related information; installation of semiconductor photomask inspection equipment and provision of related information; maintenance, repair, and cleaning of semiconductor photomask writing equipment and provision of related information; installation of semiconductor photomask writing equipment and provision of related information.

Photomask writing machines and tools for semiconductors; metalworking machines and tools; semiconductor manufacturing machines; mask aligners [semiconductor manufacturing machines]; electron beam semiconductor manufacturing machines; electronic circuits manufacturing machines; semiconductor wafer processing machines; semiconductor elements manufacturing machines; substrate separation equipment for semiconductor manufacturing machines; washing apparatus for semiconductor manufacturing machines; filters being parts of semiconductor manufacturing machines; washing apparatus for semiconductor wafer and integrated circuit; polishing machines for manufacturing machines of semiconductor and semiconductor elements; polishing machines for semiconductor wafers; polishing equipment for semiconductor wafers and integrated circuits; grinding equipment for manufacturing machines of semiconductor and semiconductor elements; grinding equipment for semiconductor wafers and integrated circuits; laser engraving machines for manufacturing machines of semiconductor and semiconductor elements; semiconductor wafer processing equipment; plasma etching machines; film deposition machines for semiconductor manufacturing; epitaxial reactors for semiconductor manufacturing; chemical vapor deposition (cvd) equipment for semiconductor manufacturing; chemical vapor deposition [cvd] reactors for semiconductor manufacturing; ion implanters for semiconductor manufacturing; electronic component manufacturing machines; injector for semiconductor manufacturing machines; semiconductor exposure apparatus for use in manufacture; wafer coating and development and baking equipment for semiconductor manufacturing; defect correction machines for semiconductor photomask, semiconductor reticle and semiconductor wafer; defect correction, foreign matter inspection and measurement machines for semiconductor and semiconductor elements; equipment for attaching pellicle (dust-proof protective film) to a photomask in the manufacturing process of semiconductors and semiconductor elements; metal organic chemical vapor deposition (mocvd) apparatus; control units for semiconductor manufacturing machines (including vacuum pressure controllers, temperature controllers, and rotation controllers); gas supply units for semiconductor manufacturing machines; exhaust gas treatment units for semiconductor manufacturing machines; wafer transfer units for semiconductor manufacturing machines; wafer transfer robots for semiconductor manufacturing machines; wafer cleaning units for semiconductor manufacturing machines; temperature measurement units for semiconductor manufacturing machines; wafer warp measurement units for semiconductor manufacturing machines.

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Source: USPTO federal trademark records. Informational only, not legal advice. Status and details may lag the live USPTO database.