U.S. federal trademark · Serial No. 78222793 · Reg. No. 4769345
Consulting services relating to semiconductor manufacturing apparatus and flat panel display manufacturing apparatus; consulting services relating to operational and functional aspects of optical measuring machines and apparatus for measuring film thickness and size and shape of wafers, and for particle inspection; repair, installation and maintenance of computer programs and software
Optical digital measuring systems sold as a unit for measuring critical dimensions,profile and film thickness in semiconductor manufacturing, comprising, namely, an electric light source, a spectroscopic elipsometry, reflectometry, computer hardware, critical dimensions metrology software and, profile and thickness semiconductor measurement software
Repair, installation and maintenance of measuring apparatus; repair, installation and maintenance of computers, including CPU and peripheral equipment
Source: USPTO federal trademark records. Informational only, not legal advice. Status and details may lag the live USPTO database.