U.S. federal trademark · Serial No. 78252031 · Reg. No. 4769345
(based on 44(d) ) consulting services relating to semiconductor manufacturing apparatus and flat panel display manufacturing apparatus and flat panel display manufacturing apparatus; consulting services relating to operational and functional aspects of optical measuring machines and apparatus for measuring film thickness and size and shape of wafers, and for particle inspection; repair, installation and maintenance of computer programs software
(Based on Use in Commerce) Optical digital measuring systems sold as a unit for measuring critical dimensions, profile and film thickness in semiconductor manufacturing, comprising, namely, an electric light source, a spectroscopic elipsometry, reflectometry, computer hardware, critical dimensions metrology software and, profile and thickness semiconductor measurement software
(based on 44(d)) repair, installation, and maintenance of optical digital measurement apparatus for measuring critical dimensions, profile and film thickness in semiconductor and flat panel display manufacturing; repair, installation and maintenance of computers, including CPU and peripheral equipment
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