Analytical tools for use in energetic beam microscopes, namely, nano-manipulators, in-situ probe tip exchange tool, TEM and atom-probe sample preparation tool, gas injection tool, and sensitive-sample transfer tool; sample holders and probe-tip holders for use with the foregoing tools; application software for the operation of all the foregoing tools; consumable parts for the foregoing tools, namely, probe tips, lift-out grids for holding samples for electron microscope examination, and coupons in the nature of templates for making lift-out grids for the same

'analyt':1 'applic':50 'atom':23 'atom-prob':22 'beam':7 'consum':60 'coupon':81 'electron':77 'energet':6 'examin':79 'exchang':18 'forego':48,58,64 'gas':28 'grid':72,92 'hold':74 'holder':38,43 'in-situ':13 'inject':29 'lift':70,90 'lift-out':69,89 'make':88 'manipul':12 'microscop':8,78 'name':9,66 'nano':11 'nano-manipul':10 'natur':84 'oper':54 'part':61 'prepar':26 'probe':16,24,41,67 'probe-tip':40 'sampl':25,34,37,75 'sensit':33 'sensitive-sampl':32 'situ':15 'softwar':51 'tem':20 'templat':86 'tip':17,42,68 'tool':2,19,27,30,36,49,59,65 'transfer':35 'use':4,45

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