U.S. federal trademark · Serial No. 87917601 · Reg. No. 5747764
Computer programs for detecting defects in the image pattern and design layout pattern of electronic circuits by optical microscopes, electron beam microscopes or scanning electron microscopes; Computer programs and computer software for detecting defects in the image pattern and design layout pattern of electronic circuits by optical microscopes, electron beam microscopes or scanning electron microscopes; data processing programs for detecting defects in the image pattern and design layout pattern of electronic circuits by optical microscopes, electron beam microscopes or scanning electron microscopes
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