U.S. federal trademark · Serial No. 88130838 · Reg. No. 6054133
Semiconductor wafer optical inspection apparatus; Optical apparatus for inspection of semiconductor materials, namely, semiconductor wafers, semiconductor devices and semiconductor die; Semiconductor wafer electronic inspection apparatus; Electronic apparatus for inspection of semiconductor materials, namely, semiconductor wafers, semiconductor devices and semiconductor die; computer software for use in inspecting semiconductor wafers; computer software for use in testing and inspecting semiconductor materials, namely, semiconductor wafers, semiconductor devices and semiconductor die
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