U.S. federal trademark · Serial No. 79357009 · Reg. No. 7349517
Optical inspection apparatus for semi-conductor materials and elements; confocal microscopes; semi-conductor testing machines and instruments; electron microscopes; differential interferometry detectors; testing apparatus not for medical purposes, namely, semiconductor testing apparatus; precision differential Interferometric measuring apparatus; data sets, downloadable, in the field of semiconductors; computer software, recorded, for controlling confocal microscopes; computer software applications, downloadable, for operating confocal microscopes; computer hardware; computer programs, downloadable, for recording images from confocal microscopes
Source: USPTO federal trademark records. Informational only, not legal advice. Status and details may lag the live USPTO database.