Capital equipment for the semiconductor manufacturing industry, namely, inspection and test apparatus for measuring the performance characteristics of semiconductors

'apparatus':12 'capit':1 'characterist':17 'equip':2 'industri':7 'inspect':9 'manufactur':6 'measur':14 'name':8 'perform':16 'semiconductor':5,19 'test':11

Installation of capital equipment for semiconductor manufacturing, namely, inspection and test systems for semiconductor manufacturing

'capit':3 'equip':4 'inspect':9 'instal':1 'manufactur':7,15 'name':8 'semiconductor':6,14 'system':12 'test':11

Design, development, and evaluation for the purpose of certification of capital equipment for semiconductor manufacturing for others, namely, inspection and test systems for semiconductor manufacturing

'capit':11 'certif':9 'design':1 'develop':2 'equip':12 'evalu':4 'inspect':19 'manufactur':15,25 'name':18 'other':17 'purpos':7 'semiconductor':14,24 'system':22 'test':21

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