U.S. federal trademark · Serial No. 76391600 · Reg. No. 0696587
Analytical, process control and measuring apparatus, namely, reflectometers, spectrometers, x-ray fluorescence analyzers and x-ray diffraction meters for the cement, steel, aluminum, petrochemicals, industrial minerals, glass and polymers industry, and to customers in research and development institutions; metrology tools, namely, reflectometers, spectrometers, x-ray fluorescence analyzers and x-ray diffraction meters for both silicon and compound semiconductor applications, x-ray fluorescence wafer and disc analyzers [ and automated ellipsometers ] for the silicon semiconductor industry, for analyzing film thickness, composition and density; x-ray diffraction, namely, x-ray diffraction meters for the compound semiconductor industry; x-ray tubes, not for medical purposes; operating software for industrial process control and for research and development applications
Source: USPTO federal trademark records. Informational only, not legal advice. Status and details may lag the live USPTO database.