Scanning probe microscopes for semiconductor processing; scanning probe microscopes; magnetic measuring apparatus and instruments used to generate and measure magnetic fields; electron microscopes; precision measuring apparatus for high-resolution measurement of nanometer-sized particles, nanostructures, and surface characteristics, as well as for measuring the particle sizes of semiconductors, nanosensors, and nanostructures; surface roughness testing machines and instruments; microscopes

'apparatus':12,26 'characterist':40 'electron':22 'field':21 'generat':17 'high':29 'high-resolut':28 'instrument':14,59 'machin':57 'magnet':10,20 'measur':11,19,25,31,45 'microscop':3,9,23,60 'nanomet':34 'nanometer-s':33 'nanosensor':51 'nanostructur':37,53 'particl':36,47 'precis':24 'probe':2,8 'process':6 'resolut':30 'rough':55 'scan':1,7 'semiconductor':5,50 'size':35,48 'surfac':39,54 'test':56 'use':15 'well':42

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