U.S. federal trademark · Serial No. 79351270 · Reg. No. 7333863
Semiconductor photomask optical inspection apparatus; imaging apparatus, namely, optical imaging apparatus for inspection of semiconductor photomasks; semiconductor reticle optical inspection apparatus; imaging apparatus, namely, optical imaging apparatus for inspection of semiconductor reticles; semiconductor pellicle optical inspection apparatus; imaging apparatus, namely, optical imaging apparatus for inspection of semiconductor pellicles; optical inspection apparatus for semi-conductor materials and elements; semiconductor defect detectors; testing apparatus not for medical purposes, namely, semiconductor testing apparatus; precision measuring apparatus for defects of photomasks, reticles or pellicles; data sets, downloadable, in the field of semiconductors; computer software, recorded, for operating semiconductor photomasks, reticles or pellicles inspection apparatus; computer software applications, downloadable, for operating semiconductor photomasks, reticles or pellicles inspection apparatus; computer programs, downloadable, for operating semiconductor photomasks, reticles or pellicles inspection apparatus
Source: USPTO federal trademark records. Informational only, not legal advice. Status and details may lag the live USPTO database.