Components and component assemblies for integrated circuit and semiconductor testing apparatus and machines, namely, contactors and contactor probe cards for use in testing equipment to test electronic circuits and electronic devices, namely semiconductor wafer, integrated circuits, printed circuit boards, semiconductor chips, and packaged semiconductor devices

'apparatus':11 'assembl':4 'board':39 'card':19 'chip':41 'circuit':7,28,36,38 'compon':1,3 'contactor':15,17 'devic':31,45 'electron':27,30 'equip':24 'integr':6,35 'machin':13 'name':14,32 'packag':43 'print':37 'probe':18 'semiconductor':9,33,40,44 'test':10,23,26 'use':21 'wafer':34

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