U.S. federal trademark · Serial No. 50019978
Semiconductor testing apparatus; Optical testing instruments for measuring photonic devices; Electronic test and measurement devices for use in manufacturing semiconductor devices; Opto-electric testing apparatus; Silicon photonics testing apparatus; Computer component testing and calibrating equipment; Computer hardware for testing and analyzing computer hardware, logic devices, memory, semiconductors, chips, wafers, optical engine, co-packaged module, and silicon photonics; Recorded computer software for testing and analyzing computer hardware, logic devices, memory, semiconductors, chips, wafers, optical engine, co-packaged module, and silicon photonics
Source: USPTO federal trademark records. Informational only, not legal advice. Status and details may lag the live USPTO database.