topography and recognition imaging atomic force microscope (AFM) and microprocessor, controller, amplifier, laser, piezoelectric transducer and position sensitive detector used to chart variations in the topography of a sample and the presence of chemical or biological agents on the surface of a sample, all for use with atomic force microscopes

'afm':8 'agent':37 'amplifi':12 'atom':5,48 'biolog':36 'chart':22 'chemic':34 'control':11 'detector':19 'forc':6,49 'imag':4 'laser':13 'microprocessor':10 'microscop':7,50 'piezoelectr':14 'posit':17 'presenc':32 'recognit':3 'sampl':29,43 'sensit':18 'surfac':40 'topographi':1,26 'transduc':15 'use':20,46 'variat':23

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