U.S. federal trademark · Serial No. 90901335
probes for testing semiconductors; semiconductor testing apparatus; semiconductor testing apparatus, namely, machines and equipment for inspection of semiconductor wafers; probes for testing semiconductors, namely, contact probes for printed circuit boards; scanning probe microscopes; testing probes for testing semiconductors; semiconductor testing apparatus, namely, electronic inspection machines and equipment for the physical inspection of wafers, semiconductors, and semiconductor packages
Source: USPTO federal trademark records. Informational only, not legal advice. Status and details may lag the live USPTO database.