DESIGN OF INTEGRATED CIRCUITS FOR OTHERS; TESTING OF NEW PRODUCTS FOR OTHERS, NAMELY SEMICONDUCTOR WAFERS; AND TESTING OF SEMICONDUCTOR WAFERS FOR OTHERS, NAMELY ANALYTICAL RELIABILITY AND ENVIRONMENTAL TESTING

'analyt':24 'circuit':4 'design':1 'environment':27 'integr':3 'name':13,23 'new':9 'other':6,12,22 'product':10 'reliabl':25 'semiconductor':14,19 'test':7,17,28 'wafer':15,20

CUSTOM MANUFACTURE OF INTEGRATED CIRCUITS FOR OTHERS; AND CUSTOM MANUFACTURE OF SEMICONDUCTOR WAFERS FOR OTHERS

'circuit':5 'custom':1,9 'integr':4 'manufactur':2,10 'other':7,15 'semiconductor':12 'wafer':13

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