U.S. federal trademark · Serial No. 88392289 · Reg. No. 6056496
scientific electronic testing and measuring instruments and apparatus, namely, microelectromechanical and scanning microwave impedance microscopy devices and parts therefore, for nanometer scale testing and measuring of materials for microwave electrical properties and optical imagery systems; microscopes for atomic force microscopy in order to measure local conductivity and permittivity of materials, and scanning microwave impedance microscopy, all on the nanometer scale; and computer hardware and software for use in conjunction therewith, for testing, assessment, precision measurement and characterization in various applications, namely: microelectronics, ferroelectrics, dopant profiling, failure analysis, thin films, buried charge, graphene, carbon nanotubes, semiconductors, industrial materials, nano materials and other microscopy applications on the nanometer scale
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