scientific, electrical, photographic, optical measuring and controlling apparatuses and instruments, namely, wafer testing and probing systems and chambers for wafer testing and probing, and data processing equipment and computers, namely, control and processing systems for controlling wafer testing and processing test data obtained therefrom

'apparatus':8 'chamber':18 'comput':29 'control':7,31,36 'data':25,42 'electr':2 'equip':27 'instrument':10 'measur':5 'name':11,30 'obtain':43 'optic':4 'photograph':3 'probe':15,23 'process':26,33,40 'scientif':1 'system':16,34 'test':13,21,38,41 'therefrom':44 'wafer':12,20,37

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