U.S. federal trademark · Serial No. 86293965
Probes for testing integrated circuits; Test pins for testing circuit boards; Probes for testing semiconductors; Probe cards for use in connection with inspection of semiconductors and liquid crystal display panels; Probe cards for testing wafer; Testing apparatus for testing circuit boards; Testing apparatus for testing integrated circuits; Testing apparatus for testing semiconductors
Source: USPTO federal trademark records. Informational only, not legal advice. Status and details may lag the live USPTO database.