Testing apparatus, namely, testing equipment for detecting manufacturing defects and design flaws in electronics and electromechanical devices; testing apparatus, namely, Highly Accelerated Stress Screen (HASS) and Highly Accelerated Stress Audit (HASA) testing equipment which subjects a product to a series of overstresses for detecting manufacturing defects and design flaws in electronic and electromechanical assemblies

'acceler':22,28 'apparatus':2,19 'assembl':54 'audit':30 'defect':9,46 'design':11,48 'detect':7,44 'devic':17 'electromechan':16,53 'electron':14,51 'equip':5,33 'flaw':12,49 'hasa':31 'hass':25 'high':21,27 'manufactur':8,45 'name':3,20 'overstress':42 'product':37 'screen':24 'seri':40 'stress':23,29 'subject':35 'test':1,4,18,32

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