Optical profilers; optical lenses; ultrasonic flaw detectors; infrared detection apparatus; electro-optical instruments for use in inspection and measurement of industrial components; optical inspection apparatus; lasers for measuring purposes; electronic apparatus for testing compression, strength, hardness and tensile characteristics of industrial materials; industrial X-ray apparatus in the nature of testing equipment for determining industrial flaws; semiconductor testing apparatus; transducers that utilize ultrasonic oscillations to test for stress and fatigue in metal and metal structures; electronic chips for the manufacture of integrated circuits

'apparatus':10,26,32,48,61 'characterist':40 'chip':79 'circuit':85 'compon':23 'compress':35 'detect':9 'detector':7 'determin':56 'electro':12 'electro-opt':11 'electron':31,78 'equip':54 'fatigu':72 'flaw':6,58 'hard':37 'industri':22,42,44,57 'infrar':8 'inspect':18,25 'instrument':14 'integr':84 'laser':27 'lens':4 'manufactur':82 'materi':43 'measur':20,29 'metal':74,76 'natur':51 'optic':1,3,13,24 'oscil':66 'profil':2 'purpos':30 'ray':47 'semiconductor':59 'strength':36 'stress':70 'structur':77 'tensil':39 'test':34,53,60,68 'transduc':62 'ultrason':5,65 'use':16 'util':64 'x':46 'x-ray':45

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