Astronometric measuring machines and instruments; Automatic liquid-flow control machines and instruments; Automatic pressure control machines and instruments; Instruments for detecting and measuring two-dimensional distribution of force and pressure; Instruments for measuring length; Measurement standard devices for nanometrology, namely measuring tools having a pattern in the micrometer or nanometer ranges; Measuring instrumentation and apparatus, namely digitizers; Precision instruments for manipulation an dpositioning of microscopic objects; Scientific measuring instruments, namely conductivity meters; Seismological instruments; Sound recording apparatus and instruments ; Surface roughness testing machines and instruments

'apparatus':57,79 'astronometr':1 'automat':6,14 'conduct':73 'control':10,16 'detect':22 'devic':39 'digit':59 'dimension':27 'distribut':28 'dposit':65 'flow':9 'forc':30 'instrument':5,13,19,20,33,55,61,71,76,81,87 'length':36 'liquid':8 'liquid-flow':7 'machin':3,11,17,85 'manipul':63 'measur':2,24,35,37,43,54,70 'meter':74 'micromet':50 'microscop':67 'name':42,58,72 'nanomet':52 'nanometrolog':41 'object':68 'pattern':47 'precis':60 'pressur':15,32 'rang':53 'record':78 'rough':83 'scientif':69 'seismolog':75 'sound':77 'standard':38 'surfac':82 'test':84 'tool':44 'two':26 'two-dimension':25

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